Title
Recent Patent Eligibility Development Impacting Litigation and Prosecution in the U.S. and Japan
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Event Name
Global Innovation Law Summit
Date
7-15-2021
Program
Welcome
- Robert Gomulkiewicz, University of Washington School of Law
Recent Patent Eligibility Developments Impacting Litigation and Prosecution in the U.S. and Japan
- Introductory Remarks: Toshiko Takenaka, University of Washington School of Law/Keio University Law School
- Keynote speaker: Judge Raymond Chen, The United States Court of Appeals for the Federal Circuit
- Moderator: Paul Meiklejohn, Dorsey & Whitney, Seattle, WA
- Martin Adelman, George Washington University School of Law, Washington DC
- Stephen Kunin, Maier & Maier, Alexandria, VA
- William LaMarca, Special Counsel for IP Litigation, Office of the Solicitor, U.S. Patent & Trademark Office
- Yoshinari Oyama, Senior Director of NEDO Silicon Valley Office, JPO Examiner
Recommended Citation
Robert W. Gomulkiewicz, Toshiko Takenaka Prof., Judge Raymond Chen, Paul Meiklejohn, Martin Adelman, Stephen Kunin, William LaMarca, and Yoshinari Oyama, Recent Patent Eligibility Development Impacting Litigation and Prosecution in the U.S. and Japan (2021), https://digitalcommons.law.uw.edu/gils/2
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