Title

Recent Patent Eligibility Development Impacting Litigation and Prosecution in the U.S. and Japan

Presenters

Robert W. GomulkiewiczFollow
Toshiko Takenaka Prof., University of Washington School of LawFollow
Judge Raymond Chen
Paul Meiklejohn
Martin Adelman
Stephen Kunin
William LaMarca
Yoshinari Oyama

Event Name

Global Innovation Law Summit

Date

7-15-2021

Program

Welcome

• Robert Gomulkiewicz, University of Washington School of Law

Recent Patent Eligibility Developments Impacting Litigation and Prosecution in the U.S. and Japan

• Introductory Remarks: Toshiko Takenaka, University of Washington School of Law/Keio University Law School
• Keynote speaker: Judge Raymond Chen, The United States Court of Appeals for the Federal Circuit
• Moderator: Paul Meiklejohn, Dorsey & Whitney, Seattle, WA
• Martin Adelman, George Washington University School of Law, Washington DC
• Stephen Kunin, Maier & Maier, Alexandria, VA
• William LaMarca, Special Counsel for IP Litigation, Office of the Solicitor, U.S. Patent & Trademark Office
• Yoshinari Oyama, Senior Director of NEDO Silicon Valley Office, JPO Examiner

Recommended Citation

Robert W. Gomulkiewicz, Toshiko Takenaka Prof., Judge Raymond Chen, Paul Meiklejohn, Martin Adelman, Stephen Kunin, William LaMarca, and Yoshinari Oyama, Recent Patent Eligibility Development Impacting Litigation and Prosecution in the U.S. and Japan (2021), https://digitalcommons.law.uw.edu/gils/2